DELA: A Novel Approach for Detecting Errors Induced by Large Atomic Condition Numbers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tan, Youshuai, Zhang, Zhanwei, Chen, Jinfu, Ding, Zishuo, Xuan, Jifeng, Shang, Weiyi
Format:	Preprint
Published:	2024
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2412.20804