Study on the efficiency droop in high-quality GaN material under high photoexcitation intensity

Fuente: arXiv
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Bibliographic Details
Main Authors: Chen, Peng, Xie, Zili, Xiu, Xiangqian, Chen, Dunjun, Liu, Bin, Zhao, Hong, Shi, Yi, Zhang, Rong, Zheng, Youdou
Format: Preprint
Published: 2024
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