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Autori principali: Dan, Zhiying, Emami, Ronak Sarmasti, Feraco, Giovanna, Vavali, Melina, Gerlach, Dominic, Rudolf, Petra, Grubišić-Čabo, Antonija
Natura: Preprint
Pubblicazione: 2025
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Accesso online:https://arxiv.org/abs/2501.00815
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author Dan, Zhiying
Emami, Ronak Sarmasti
Feraco, Giovanna
Vavali, Melina
Gerlach, Dominic
Rudolf, Petra
Grubišić-Čabo, Antonija
author_facet Dan, Zhiying
Emami, Ronak Sarmasti
Feraco, Giovanna
Vavali, Melina
Gerlach, Dominic
Rudolf, Petra
Grubišić-Čabo, Antonija
contents Two-dimensional (2D) transition metal dichalcogenides have emerged as a promising platform for next-generation optoelectronic and spintronic devices. Mechanical exfoliation using adhesive tape remains the dominant method for preparing 2D materials of highest quality, including transition metal dichalcogenides, but always results in small-sized flakes. This limitation poses a significant challenge for investigations and applications where large scale flakes are needed. To overcome these constraints, we explored the preparation of 2D WS2 and WSe2 using a recently developed kinetic in situ single-layer synthesis method (KISS). In particular, we focused on the influence of different substrates, Au and Ag, and chalcogen atoms, S and Se, on the yield and quality of the 2D films. The crystallinity and spatial morphology of the 2D films were characterized using optical microscopy and atomic force microscopy, providing a comprehensive assessment of exfoliation quality. Low-energy electron diffraction verified that there is no preferential orientation between the 2D film and the substrate, while optical microscopy revealed that WSe2 consistently outperformed WS2 in producing large monolayers, regardless of the substrate used. Finally, X-ray diffraction and X-ray photoelectron spectroscopy demonstrate that no covalent bonds are formed between the 2D material and the underlying substrate. These results identify KISS method as a non-destructive approach for a more scalable approach of high-quality 2D transition metal dichalcogenides.
format Preprint
id arxiv_https___arxiv_org_abs_2501_00815
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Role of Chalcogen atoms in In Situ Exfoliation for Large-Area 2D Semiconducting Transition Metal Dichalcogenides
Dan, Zhiying
Emami, Ronak Sarmasti
Feraco, Giovanna
Vavali, Melina
Gerlach, Dominic
Rudolf, Petra
Grubišić-Čabo, Antonija
Materials Science
Two-dimensional (2D) transition metal dichalcogenides have emerged as a promising platform for next-generation optoelectronic and spintronic devices. Mechanical exfoliation using adhesive tape remains the dominant method for preparing 2D materials of highest quality, including transition metal dichalcogenides, but always results in small-sized flakes. This limitation poses a significant challenge for investigations and applications where large scale flakes are needed. To overcome these constraints, we explored the preparation of 2D WS2 and WSe2 using a recently developed kinetic in situ single-layer synthesis method (KISS). In particular, we focused on the influence of different substrates, Au and Ag, and chalcogen atoms, S and Se, on the yield and quality of the 2D films. The crystallinity and spatial morphology of the 2D films were characterized using optical microscopy and atomic force microscopy, providing a comprehensive assessment of exfoliation quality. Low-energy electron diffraction verified that there is no preferential orientation between the 2D film and the substrate, while optical microscopy revealed that WSe2 consistently outperformed WS2 in producing large monolayers, regardless of the substrate used. Finally, X-ray diffraction and X-ray photoelectron spectroscopy demonstrate that no covalent bonds are formed between the 2D material and the underlying substrate. These results identify KISS method as a non-destructive approach for a more scalable approach of high-quality 2D transition metal dichalcogenides.
title Role of Chalcogen atoms in In Situ Exfoliation for Large-Area 2D Semiconducting Transition Metal Dichalcogenides
topic Materials Science
url https://arxiv.org/abs/2501.00815