Stochastic Thermodynamics of the Two-Dimensional Model of Transistors

Fuente: arXiv
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Autore principale: Gu, Jiayin
Natura: Preprint
Pubblicazione: 2025
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author Gu, Jiayin
author_facet Gu, Jiayin
contents We adopt a stochastic approach to study the charge transport in transistors. In this approach, the hole and electron densities are ruled by diffusion-reaction stochastic partial differential equations satisfying local detailed balance condition. The electric field is supposed to be concentrated in very narrow regions around the two junctions and is also approximated to be static. In this way, not only the laws of electricity, thermodynamics, and microreversibility is consistent within this approach, but also the transistor can be easily modeled as a two-dimensional system. We perform the full counting statistics of the two coupled currents, and the fluctuation theorem is shown to hold. Moreover, we show that the geometric shape of the transistor exert great influence on the transport behavior. By modeling the transistor in two dimensions, the signal-amplification factor up to about $164$ can be achieved, which is comparable to the typical value of realistic transistors in industry.
format Preprint
id arxiv_https___arxiv_org_abs_2501_01919
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Stochastic Thermodynamics of the Two-Dimensional Model of Transistors
Gu, Jiayin
Statistical Mechanics
We adopt a stochastic approach to study the charge transport in transistors. In this approach, the hole and electron densities are ruled by diffusion-reaction stochastic partial differential equations satisfying local detailed balance condition. The electric field is supposed to be concentrated in very narrow regions around the two junctions and is also approximated to be static. In this way, not only the laws of electricity, thermodynamics, and microreversibility is consistent within this approach, but also the transistor can be easily modeled as a two-dimensional system. We perform the full counting statistics of the two coupled currents, and the fluctuation theorem is shown to hold. Moreover, we show that the geometric shape of the transistor exert great influence on the transport behavior. By modeling the transistor in two dimensions, the signal-amplification factor up to about $164$ can be achieved, which is comparable to the typical value of realistic transistors in industry.
title Stochastic Thermodynamics of the Two-Dimensional Model of Transistors
topic Statistical Mechanics
url https://arxiv.org/abs/2501.01919