High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test

Fuente: arXiv
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Main Authors: Mizumoto, Misaki, Tamba, Tsubasa, Tsujimoto, Masahiro, Cumbee, Renata S., Eckart, Megan E., Hodges-Kluck, Edmund, Ishisaki, Yoshitaka, Kilbourne, Caroline A., Leutenegger, Maurice A., Porter, Frederick S., Sawada, Makoto, Takei, Yoh, Uchida, Yuusuke, Yamada, Shin'ya
Format: Preprint
Published: 2025
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author Mizumoto, Misaki
Tamba, Tsubasa
Tsujimoto, Masahiro
Cumbee, Renata S.
Eckart, Megan E.
Hodges-Kluck, Edmund
Ishisaki, Yoshitaka
Kilbourne, Caroline A.
Leutenegger, Maurice A.
Porter, Frederick S.
Sawada, Makoto
Takei, Yoh
Uchida, Yuusuke
Yamada, Shin'ya
author_facet Mizumoto, Misaki
Tamba, Tsubasa
Tsujimoto, Masahiro
Cumbee, Renata S.
Eckart, Megan E.
Hodges-Kluck, Edmund
Ishisaki, Yoshitaka
Kilbourne, Caroline A.
Leutenegger, Maurice A.
Porter, Frederick S.
Sawada, Makoto
Takei, Yoh
Uchida, Yuusuke
Yamada, Shin'ya
contents The spectroscopic performance of an X-ray microcalorimeter is compromised at high count rates. In this study, we utilize the Resolve X-ray microcalorimeter onboard the XRISM satellite to examine the effects observed during high count rate measurements and propose modeling approaches to mitigate them. We specifically address the following instrumental effects that impact performance: CPU limit, pile-up, and untriggered electrical cross talk. Experimental data at high count rates were acquired during ground testing using the flight model instrument and a calibration X-ray source. In the experiment, data processing not limited by the performance of the onboard CPU was run in parallel, which cannot be done in orbit. This makes it possible to access the data degradation caused by limited CPU performance. We use these data to develop models that allow for a more accurate estimation of the aforementioned effects. To illustrate the application of these models in observation planning, we present a simulated observation of GX 13+1. Understanding and addressing these issues is crucial to enhancing the reliability and precision of X-ray spectroscopy in situations characterized by elevated count rates.
format Preprint
id arxiv_https___arxiv_org_abs_2501_03283
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test
Mizumoto, Misaki
Tamba, Tsubasa
Tsujimoto, Masahiro
Cumbee, Renata S.
Eckart, Megan E.
Hodges-Kluck, Edmund
Ishisaki, Yoshitaka
Kilbourne, Caroline A.
Leutenegger, Maurice A.
Porter, Frederick S.
Sawada, Makoto
Takei, Yoh
Uchida, Yuusuke
Yamada, Shin'ya
Instrumentation and Methods for Astrophysics
The spectroscopic performance of an X-ray microcalorimeter is compromised at high count rates. In this study, we utilize the Resolve X-ray microcalorimeter onboard the XRISM satellite to examine the effects observed during high count rate measurements and propose modeling approaches to mitigate them. We specifically address the following instrumental effects that impact performance: CPU limit, pile-up, and untriggered electrical cross talk. Experimental data at high count rates were acquired during ground testing using the flight model instrument and a calibration X-ray source. In the experiment, data processing not limited by the performance of the onboard CPU was run in parallel, which cannot be done in orbit. This makes it possible to access the data degradation caused by limited CPU performance. We use these data to develop models that allow for a more accurate estimation of the aforementioned effects. To illustrate the application of these models in observation planning, we present a simulated observation of GX 13+1. Understanding and addressing these issues is crucial to enhancing the reliability and precision of X-ray spectroscopy in situations characterized by elevated count rates.
title High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test
topic Instrumentation and Methods for Astrophysics
url https://arxiv.org/abs/2501.03283