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Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Golden, Evan B., Parmar, Neel A., Semenov, Vasili K., Tolpygo, Sergey K.
Formato:	Preprint
Publicado:	2025
Materias:	Superconductivity Mesoscale and Nanoscale Physics Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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