Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions

Fuente: arXiv
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Bibliographic Details
Main Authors: Golden, Evan B., Parmar, Neel A., Semenov, Vasili K., Tolpygo, Sergey K.
Format: Preprint
Published: 2025
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