Detecting Defective Wafers Via Modular Networks

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Yifeng, Baker, Bryan, Chen, Shi, Zhang, Chao, Huang, Yu, Zhao, Qi, Bom, Sthitie
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2501.03368