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Detecting Defective Wafers Via Modular Networks

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Zhang, Yifeng, Baker, Bryan, Chen, Shi, Zhang, Chao, Huang, Yu, Zhao, Qi, Bom, Sthitie
Formato:	Preprint
Publicado:	2025
Materias:	Machine Learning
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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