Paruchuri, A., Thrasher, C., Hart, A. J., Macfarlane, R., & Jayaraman, A. (2025). Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices.
Chicago Style (17th ed.) CitationParuchuri, Aanish, Carl Thrasher, A. J. Hart, Robert Macfarlane, and Arthi Jayaraman. Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices. 2025.
MLA (9th ed.) CitationParuchuri, Aanish, et al. Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices. 2025.
Warning: These citations may not always be 100% accurate.