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Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Paruchuri, Aanish, Thrasher, Carl, Hart, A. J., Macfarlane, Robert, Jayaraman, Arthi
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Materials Science Computer Vision and Pattern Recognition Image and Video Processing
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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