Impact of impurities on leakage current induced by High-Energy Density Pulsed Laser Annealing in Si diodes

Fuente: arXiv

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Bibliographic Details
Main Authors:	Monflier, Richard, Daubriac, Richard, Haned, Mahmoud, Tabata, Toshiyuki, Olivier, François, Imbernon, Eric, Italia, Markus, La Magna, Antonino, Mazzamuto, Fulvio, Boninelli, Simona, Cristiano, Fuccio, Pereira, Elena Bedel
Format:	Preprint
Published:	2025
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2501.07168