Phenomenological model of crack patterns in thin colloidal films undergoing desiccation
Fuente:
arXiv
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| Autori principali: | , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866912315479162880 |
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| author | Tarasevich, Yuri Yu. Eserkepov, Andrei V. Vodolazskaya, Irina V. Chatterjee, Avik P. |
| author_facet | Tarasevich, Yuri Yu. Eserkepov, Andrei V. Vodolazskaya, Irina V. Chatterjee, Avik P. |
| contents | A number of geometric and topological properties of samples of crack-template based conductive films are examined to assess the degree to which Voronoi diagrams can successfully model structure and conductivity in such networks. Our analysis suggests that although Poisson--Voronoi diagrams are only partially successful in modeling structural features of real-world crack patterns formed in films undergoing desiccation, such diagrams can nevertheless be useful in situations where topological characteristics are more important than geometric ones. A phenomenological model is proposed that is more accurate at capturing features of the real-world crack patterns. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2501_07303 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Phenomenological model of crack patterns in thin colloidal films undergoing desiccation Tarasevich, Yuri Yu. Eserkepov, Andrei V. Vodolazskaya, Irina V. Chatterjee, Avik P. Disordered Systems and Neural Networks Statistical Mechanics A number of geometric and topological properties of samples of crack-template based conductive films are examined to assess the degree to which Voronoi diagrams can successfully model structure and conductivity in such networks. Our analysis suggests that although Poisson--Voronoi diagrams are only partially successful in modeling structural features of real-world crack patterns formed in films undergoing desiccation, such diagrams can nevertheless be useful in situations where topological characteristics are more important than geometric ones. A phenomenological model is proposed that is more accurate at capturing features of the real-world crack patterns. |
| title | Phenomenological model of crack patterns in thin colloidal films undergoing desiccation |
| topic | Disordered Systems and Neural Networks Statistical Mechanics |
| url | https://arxiv.org/abs/2501.07303 |