Saved in:
Bibliographic Details
Main Authors: Margiotta, Stephen, Liu, Binzhi, Khan, Saleh Ahmed, Ortiz, Gabriel Calderon, Ibreljic, Ahmed, Hwang, Jinwoo, Bhuiyan, A F M Anhar Uddin
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2501.07780
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866913864709308416
author Margiotta, Stephen
Liu, Binzhi
Khan, Saleh Ahmed
Ortiz, Gabriel Calderon
Ibreljic, Ahmed
Hwang, Jinwoo
Bhuiyan, A F M Anhar Uddin
author_facet Margiotta, Stephen
Liu, Binzhi
Khan, Saleh Ahmed
Ortiz, Gabriel Calderon
Ibreljic, Ahmed
Hwang, Jinwoo
Bhuiyan, A F M Anhar Uddin
contents In the rapidly evolving field of quantum computing, niobium nitride (NbN) superconductors have emerged as integral components due to their unique structural properties, including a high superconducting transition temperature (Tc), exceptional electrical conductivity, and compatibility with advanced device architectures. This study investigates the impact of high-temperature annealing and high-dose gamma irradiation on the structural and superconducting properties of NbN films grown on GaN via reactive DC magnetron sputtering. The as-deposited cubic δ-NbN (111) films exhibited a high-intensity XRD peak, high Tc of 12.82K, and an atomically flat surface. Annealing at 500 and 950 °C for varying durations revealed notable structural and surface changes. High-resolution STEM indicated improved local ordering, while AFM showed reduced surface roughness after annealing. XPS revealed a gradual increase in the Nb/N ratio with higher annealing temperatures and durations. High-resolution XRD and STEM analyses showed lattice constant modifications in δ-NbN films, attributed to residual stress changes following annealing. Additionally, XRD phi-scans revealed sixfold symmetry in NbN films due to rotational domains relative to GaN. While Tc remained stable after annealing at 500 °C, increasing the annealing temperature to 950 °C degraded Tc to ~8K and reduced the residual resistivity ratio from 0.85 in as-deposited films to 0.29 after 30 minutes. The effects of gamma radiation (5 Mrad (Si)) were also studied, demonstrating minimal changes to crystallinity and superconducting performance, indicating excellent radiation resilience. These findings highlight the potential of NbN superconductors for integration into advanced quantum devices and their suitability for applications in radiation-intensive environments such as space, satellites, and nuclear power plants.
format Preprint
id arxiv_https___arxiv_org_abs_2501_07780
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Thermal Annealing and Radiation Effects on Structural and Electrical Properties of NbN/GaN Superconductor/Semiconductor Junction
Margiotta, Stephen
Liu, Binzhi
Khan, Saleh Ahmed
Ortiz, Gabriel Calderon
Ibreljic, Ahmed
Hwang, Jinwoo
Bhuiyan, A F M Anhar Uddin
Superconductivity
Quantum Physics
In the rapidly evolving field of quantum computing, niobium nitride (NbN) superconductors have emerged as integral components due to their unique structural properties, including a high superconducting transition temperature (Tc), exceptional electrical conductivity, and compatibility with advanced device architectures. This study investigates the impact of high-temperature annealing and high-dose gamma irradiation on the structural and superconducting properties of NbN films grown on GaN via reactive DC magnetron sputtering. The as-deposited cubic δ-NbN (111) films exhibited a high-intensity XRD peak, high Tc of 12.82K, and an atomically flat surface. Annealing at 500 and 950 °C for varying durations revealed notable structural and surface changes. High-resolution STEM indicated improved local ordering, while AFM showed reduced surface roughness after annealing. XPS revealed a gradual increase in the Nb/N ratio with higher annealing temperatures and durations. High-resolution XRD and STEM analyses showed lattice constant modifications in δ-NbN films, attributed to residual stress changes following annealing. Additionally, XRD phi-scans revealed sixfold symmetry in NbN films due to rotational domains relative to GaN. While Tc remained stable after annealing at 500 °C, increasing the annealing temperature to 950 °C degraded Tc to ~8K and reduced the residual resistivity ratio from 0.85 in as-deposited films to 0.29 after 30 minutes. The effects of gamma radiation (5 Mrad (Si)) were also studied, demonstrating minimal changes to crystallinity and superconducting performance, indicating excellent radiation resilience. These findings highlight the potential of NbN superconductors for integration into advanced quantum devices and their suitability for applications in radiation-intensive environments such as space, satellites, and nuclear power plants.
title Thermal Annealing and Radiation Effects on Structural and Electrical Properties of NbN/GaN Superconductor/Semiconductor Junction
topic Superconductivity
Quantum Physics
url https://arxiv.org/abs/2501.07780