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One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories

Fuente: arXiv

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Bibliographic Details
Main Authors:	Acal, Christian, Ruiz-Castro, Juan Eloy, Maldonado, David, Roldán, Juan B.
Format:	Preprint
Published:	2025
Subjects:	Methodology
Online Access:	Acceder al recurso
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