Dielectric permittivity extraction of MoS$_2$ nanoribbons using THz nanoscopy

Fuente: arXiv
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Autores principales: Lassen, Henrik B., Carstensen, William V., Miakota, Denys I., Ghimire, Ganesh, Canulescu, Stela, Jepsen, Peter U., Kelleher, Edmund J. R.
Formato: Preprint
Publicado: 2025
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author Lassen, Henrik B.
Carstensen, William V.
Miakota, Denys I.
Ghimire, Ganesh
Canulescu, Stela
Jepsen, Peter U.
Kelleher, Edmund J. R.
author_facet Lassen, Henrik B.
Carstensen, William V.
Miakota, Denys I.
Ghimire, Ganesh
Canulescu, Stela
Jepsen, Peter U.
Kelleher, Edmund J. R.
contents The nanoscale optical properties of high-quality MoS$_2$ nanoribbons are investigated using THz nanoscopy based on a scattering-type scanning probe. The nanoribbons comprise a multi-layer core, surrounded by monolayer edges. A featureless complex permittivity spectrum covering the range 0.6-1.6 THz is extracted from experimental time-domain measurements through a minimization procedure, adopting an extended finite-dipole model of the probe-sample interaction. Real-space mapping of the nanoribbon reveals variations in the local permittivity down to the instrument-limited resolution, on the order of 30 nm. Clustering analysis statistically identifies regions of lower apparent permittivity that we attribute to a high curvature at the edges of the nanoribbon causing an increase in local material strain or cross-talk in the measured signal with topography-induced measurement artifacts. The core of the nanoribbon contains two regions that follow tightly distributed, but slightly shifted Gaussian statistics in complex permittivity space, with the real part mean of both distributions lying around 5.4 and compatible with literature values of the static permittivity of thin-film MoS$_2$ reported previously. Our results show that the nanoribbons exhibit a modest degree of dielectric variation at the nanoscale that could be explained by heterogeneous doping or variations in the local defect density. We believe that our approach could be useful for the direct real-space measurement of dielectric disorder in other low-dimensional semiconducting material systems.
format Preprint
id arxiv_https___arxiv_org_abs_2501_08427
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Dielectric permittivity extraction of MoS$_2$ nanoribbons using THz nanoscopy
Lassen, Henrik B.
Carstensen, William V.
Miakota, Denys I.
Ghimire, Ganesh
Canulescu, Stela
Jepsen, Peter U.
Kelleher, Edmund J. R.
Optics
Mesoscale and Nanoscale Physics
Materials Science
The nanoscale optical properties of high-quality MoS$_2$ nanoribbons are investigated using THz nanoscopy based on a scattering-type scanning probe. The nanoribbons comprise a multi-layer core, surrounded by monolayer edges. A featureless complex permittivity spectrum covering the range 0.6-1.6 THz is extracted from experimental time-domain measurements through a minimization procedure, adopting an extended finite-dipole model of the probe-sample interaction. Real-space mapping of the nanoribbon reveals variations in the local permittivity down to the instrument-limited resolution, on the order of 30 nm. Clustering analysis statistically identifies regions of lower apparent permittivity that we attribute to a high curvature at the edges of the nanoribbon causing an increase in local material strain or cross-talk in the measured signal with topography-induced measurement artifacts. The core of the nanoribbon contains two regions that follow tightly distributed, but slightly shifted Gaussian statistics in complex permittivity space, with the real part mean of both distributions lying around 5.4 and compatible with literature values of the static permittivity of thin-film MoS$_2$ reported previously. Our results show that the nanoribbons exhibit a modest degree of dielectric variation at the nanoscale that could be explained by heterogeneous doping or variations in the local defect density. We believe that our approach could be useful for the direct real-space measurement of dielectric disorder in other low-dimensional semiconducting material systems.
title Dielectric permittivity extraction of MoS$_2$ nanoribbons using THz nanoscopy
topic Optics
Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2501.08427