Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials

Documenti analoghi

• Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography
  di: Robert, Hoelen L. Lalandec, et al.
  Pubblicazione: (2025)
• Improving the low-dose performance of aberration correction in single sideband ptychography
  di: Li, Songge, et al.
  Pubblicazione: (2025)
• Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imaging
  di: Chennit, Tamazouzt, et al.
  Pubblicazione: (2025)
• Retrieval of phase information from low-dose electron microscopy experiments: are we at the limit yet?
  di: Ibáñez, Francisco Vega, et al.
  Pubblicazione: (2024)
• Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument
  di: Denisov, Nikita, et al.
  Pubblicazione: (2024)