Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization
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arXiv
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| Autores principales: | , , , , , , |
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| Formato: | Preprint |
| Publicado: |
2025
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| _version_ | 1866910786013626368 |
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| author | Campbell, Anna Charvátová Klapetek, Petr Šlesinger, Radek Martinek, Jan Hortvík, Václav Witkovský, Viktor Wimmer, Gejza |
| author_facet | Campbell, Anna Charvátová Klapetek, Petr Šlesinger, Radek Martinek, Jan Hortvík, Václav Witkovský, Viktor Wimmer, Gejza |
| contents | Scanning thermal microscopy is a unique tool for the study of thermal properties at the nanoscale. However, calibration of the method is a crucial problem. When analyzing local thermal conductivity, direct calibration is not possible and reference samples are used instead. As the calibration dependence is non-linear and there are only a few calibration points, this represents a metrological challenge that needs complex data processing. In this contribution we present use of the OEFPIL algorithm for robust and single-step evaluation of local thermal conductivities and their uncertainties, simplifying this procedure. Furthermore, we test the suitability of SThM calibration for automated measurement. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2501_08961 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization Campbell, Anna Charvátová Klapetek, Petr Šlesinger, Radek Martinek, Jan Hortvík, Václav Witkovský, Viktor Wimmer, Gejza Data Analysis, Statistics and Probability Materials Science Scanning thermal microscopy is a unique tool for the study of thermal properties at the nanoscale. However, calibration of the method is a crucial problem. When analyzing local thermal conductivity, direct calibration is not possible and reference samples are used instead. As the calibration dependence is non-linear and there are only a few calibration points, this represents a metrological challenge that needs complex data processing. In this contribution we present use of the OEFPIL algorithm for robust and single-step evaluation of local thermal conductivities and their uncertainties, simplifying this procedure. Furthermore, we test the suitability of SThM calibration for automated measurement. |
| title | Calibration of Scanning Thermal Microscope using Optimal Estimation of Function Parameters by Iterated Linearization |
| topic | Data Analysis, Statistics and Probability Materials Science |
| url | https://arxiv.org/abs/2501.08961 |