Microsecond Bias Polarity Switching Reveals Hidden Charge Dynamics at Halide Perovskite Interfaces

Fuente: arXiv
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Main Authors: Betušiak, Marián, Grill, Roman, Belas, Eduard, Praus, Petr, Brynza, Mykola, Karuppaiya, Mariselvam, Ahmadi, Mahshid, Yang, Jonghee, Musiienko, Artem
Format: Preprint
Published: 2025
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author Betušiak, Marián
Grill, Roman
Belas, Eduard
Praus, Petr
Brynza, Mykola
Karuppaiya, Mariselvam
Ahmadi, Mahshid
Yang, Jonghee
Musiienko, Artem
author_facet Betušiak, Marián
Grill, Roman
Belas, Eduard
Praus, Petr
Brynza, Mykola
Karuppaiya, Mariselvam
Ahmadi, Mahshid
Yang, Jonghee
Musiienko, Artem
contents We present a time-domain technique based on rapid bias polarity switching (BiPS) to probe charge transport and near-surface defects in halide perovskite single crystals. The method exploits interfacial extraction barriers, which cause carrier accumulation and subsequent release after bias reversal. BiPS combines surface sensitivity (200 nm-2 $μ$m) with millimeter-scale reach, enabling reconstruction of internal field profiles, detection of bulk space charge down to $10^9$ cm$^{-3}$, and resolution of microsecond-millisecond trap dynamics. In our setup the surface-state detection limit is $10^9$ cm$^{-2}$, and could be further improved by optimized illumination and readout. Applied to melt-grown CsPbBr$_3$ (Cr/Cr) and solution-grown MAPbBr$_3$ (Cr/SnO$_2$/Cr), BiPS reveals interfacial barriers that drive hole accumulation and defect filling. CsPbBr$_3$ shows long-lived space charge ($\sim 3\times 10^{11}$ cm$^{-3}$) and $\sim 250\times$ faster hole extraction than MAPbBr$_3$, while trap analysis yields capture times of 1-100 $μ$s, detrapping times of 20 $μ$s-3 ms, and activation energies of 300-500 meV. BiPS thus provides direct access to buried interfacial processes, disentangles electronic and ionic contributions, and offers a robust platform for evaluating contacts and guiding defect engineering in perovskite optoelectronic devices.
format Preprint
id arxiv_https___arxiv_org_abs_2501_09047
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Microsecond Bias Polarity Switching Reveals Hidden Charge Dynamics at Halide Perovskite Interfaces
Betušiak, Marián
Grill, Roman
Belas, Eduard
Praus, Petr
Brynza, Mykola
Karuppaiya, Mariselvam
Ahmadi, Mahshid
Yang, Jonghee
Musiienko, Artem
Materials Science
We present a time-domain technique based on rapid bias polarity switching (BiPS) to probe charge transport and near-surface defects in halide perovskite single crystals. The method exploits interfacial extraction barriers, which cause carrier accumulation and subsequent release after bias reversal. BiPS combines surface sensitivity (200 nm-2 $μ$m) with millimeter-scale reach, enabling reconstruction of internal field profiles, detection of bulk space charge down to $10^9$ cm$^{-3}$, and resolution of microsecond-millisecond trap dynamics. In our setup the surface-state detection limit is $10^9$ cm$^{-2}$, and could be further improved by optimized illumination and readout. Applied to melt-grown CsPbBr$_3$ (Cr/Cr) and solution-grown MAPbBr$_3$ (Cr/SnO$_2$/Cr), BiPS reveals interfacial barriers that drive hole accumulation and defect filling. CsPbBr$_3$ shows long-lived space charge ($\sim 3\times 10^{11}$ cm$^{-3}$) and $\sim 250\times$ faster hole extraction than MAPbBr$_3$, while trap analysis yields capture times of 1-100 $μ$s, detrapping times of 20 $μ$s-3 ms, and activation energies of 300-500 meV. BiPS thus provides direct access to buried interfacial processes, disentangles electronic and ionic contributions, and offers a robust platform for evaluating contacts and guiding defect engineering in perovskite optoelectronic devices.
title Microsecond Bias Polarity Switching Reveals Hidden Charge Dynamics at Halide Perovskite Interfaces
topic Materials Science
url https://arxiv.org/abs/2501.09047