Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation

Fuente: arXiv
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Auteurs principaux: He, Yan, Su, Yumin, Yang, Kaiyuan
Format: Preprint
Publié: 2025
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author He, Yan
Su, Yumin
Yang, Kaiyuan
author_facet He, Yan
Su, Yumin
Yang, Kaiyuan
contents Fault injection attacks induce hardware failures in circuits and exploit these faults to compromise the security of the system. It has been demonstrated that FIAs can bypass system security mechanisms, cause faulty outputs, and gain access to secret information. Certain types of FIAs can be mounted with little effort by tampering with clock signals and or the chip operating conditions. To mitigate such low cost, yet powerful attacks, we propose a fully synthesizable and distributable in situ fault injection monitor that employs a delay locked loop to track the pulsewidth of the clock. We further develop a fully automated design framework to optimize and implement the FIA monitors at any process node. Our design is fabricated and verified in 65 nm CMOS technology with a small footprint of 1500 um2. It can lock to clock frequencies from 2 MHz to 1.26 GHz while detecting all 12 types of possible clock glitches, as well as timing FIA injections via the supply voltage, electromagnetic signals, and chip temperature.
format Preprint
id arxiv_https___arxiv_org_abs_2501_09665
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation
He, Yan
Su, Yumin
Yang, Kaiyuan
Systems and Control
Fault injection attacks induce hardware failures in circuits and exploit these faults to compromise the security of the system. It has been demonstrated that FIAs can bypass system security mechanisms, cause faulty outputs, and gain access to secret information. Certain types of FIAs can be mounted with little effort by tampering with clock signals and or the chip operating conditions. To mitigate such low cost, yet powerful attacks, we propose a fully synthesizable and distributable in situ fault injection monitor that employs a delay locked loop to track the pulsewidth of the clock. We further develop a fully automated design framework to optimize and implement the FIA monitors at any process node. Our design is fabricated and verified in 65 nm CMOS technology with a small footprint of 1500 um2. It can lock to clock frequencies from 2 MHz to 1.26 GHz while detecting all 12 types of possible clock glitches, as well as timing FIA injections via the supply voltage, electromagnetic signals, and chip temperature.
title Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation
topic Systems and Control
url https://arxiv.org/abs/2501.09665