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Effect of Te doping in GeSe parent thick film by experimental in situ temperature-dependent structural investigation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Armand, P., Escalier, R., Silly, G., Lizion, J., Piarristeguy, A.
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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