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Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Khurana, Mohit, Delfan, Sahar, Yi, Zhenhuan
Format:	Preprint
Published:	2025
Subjects:	Optics Applied Physics
Online Access:	Acceder al recurso
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