Adapting OpenAI's CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples

Fuente: arXiv

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Bibliographic Details
Main Authors:	Megahed, Fadel M., Chen, Ying-Ju, Colosimo, Bianca Maria, Grasso, Marco Luigi Giuseppe, Jones-Farmer, L. Allison, Knoth, Sven, Sun, Hongyue, Zwetsloot, Inez
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Applications Other Statistics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2501.12596