Adapting OpenAI's CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples

Fuente: arXiv
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Autori principali: Megahed, Fadel M., Chen, Ying-Ju, Colosimo, Bianca Maria, Grasso, Marco Luigi Giuseppe, Jones-Farmer, L. Allison, Knoth, Sven, Sun, Hongyue, Zwetsloot, Inez
Natura: Preprint
Pubblicazione: 2025
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author Megahed, Fadel M.
Chen, Ying-Ju
Colosimo, Bianca Maria
Grasso, Marco Luigi Giuseppe
Jones-Farmer, L. Allison
Knoth, Sven
Sun, Hongyue
Zwetsloot, Inez
author_facet Megahed, Fadel M.
Chen, Ying-Ju
Colosimo, Bianca Maria
Grasso, Marco Luigi Giuseppe
Jones-Farmer, L. Allison
Knoth, Sven
Sun, Hongyue
Zwetsloot, Inez
contents This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.
format Preprint
id arxiv_https___arxiv_org_abs_2501_12596
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Adapting OpenAI's CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples
Megahed, Fadel M.
Chen, Ying-Ju
Colosimo, Bianca Maria
Grasso, Marco Luigi Giuseppe
Jones-Farmer, L. Allison
Knoth, Sven
Sun, Hongyue
Zwetsloot, Inez
Computer Vision and Pattern Recognition
Applications
Other Statistics
This expository paper introduces a simplified approach to image-based quality inspection in manufacturing using OpenAI's CLIP (Contrastive Language-Image Pretraining) model adapted for few-shot learning. While CLIP has demonstrated impressive capabilities in general computer vision tasks, its direct application to manufacturing inspection presents challenges due to the domain gap between its training data and industrial applications. We evaluate CLIP's effectiveness through five case studies: metallic pan surface inspection, 3D printing extrusion profile analysis, stochastic textured surface evaluation, automotive assembly inspection, and microstructure image classification. Our results show that CLIP can achieve high classification accuracy with relatively small learning sets (50-100 examples per class) for single-component and texture-based applications. However, the performance degrades with complex multi-component scenes. We provide a practical implementation framework that enables quality engineers to quickly assess CLIP's suitability for their specific applications before pursuing more complex solutions. This work establishes CLIP-based few-shot learning as an effective baseline approach that balances implementation simplicity with robust performance, demonstrated in several manufacturing quality control applications.
title Adapting OpenAI's CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples
topic Computer Vision and Pattern Recognition
Applications
Other Statistics
url https://arxiv.org/abs/2501.12596