Wafer-scale robust graphene electronics under industrial processing conditions

Fuente: arXiv
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Bibliographic Details
Main Authors: van Geest, E. P., Can, B., Makurat, M., Maheu, C., Sezen, H., Barnes, M. D., Bijl, D., Buscema, M., Shankar, S., Wehenkel, D. J., van Rijn, R., Hofmann, J. P., van Ruitenbeek, J. M., Schneider, G. F.
Format: Preprint
Published: 2025
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