Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Zonenberg, Andrew D., Moor, Antony, Slone, Daniel, Agan, Lain, Cop, Mario
Format:	Preprint
Published:	2025
Subjects:	Cryptography and Security B.7.0; C.5.4; K.6.5
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2501.13276