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| Format: | Preprint |
| Veröffentlicht: |
2025
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| Online-Zugang: | https://arxiv.org/abs/2501.13388 |
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| _version_ | 1866916662619406336 |
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| author | Iori, Tomoyuki Yukawa, Ryu |
| author_facet | Iori, Tomoyuki Yukawa, Ryu |
| contents | Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the electrical conductivity of such thin films and surfaces. Precise determination of multi-probe positions is crucial for accurate characterization of the conductance. However, traditional methods that use microscopes for determining multi-probe positions often impose significant constraints on experimental setups. In some cases, installing a microscope is not even feasible. Therefore, in this study, we propose a novel method to determine probe positions using electrical signals from the probes. This method enables precise determination of probe positions using a reference sheet and reference probes, even at low or high temperatures and under ultra-high vacuum or high-pressure conditions. The proposed method simplifies the integration of microscale multi-probe measurement systems into various devices, thereby advancing research on thin films and surfaces. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2501_13388 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Probe position determination with multichannel I-V measurements in a two-dimensional sheet$\colon$ Computational method and mathematical analysis Iori, Tomoyuki Yukawa, Ryu Applied Physics Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the electrical conductivity of such thin films and surfaces. Precise determination of multi-probe positions is crucial for accurate characterization of the conductance. However, traditional methods that use microscopes for determining multi-probe positions often impose significant constraints on experimental setups. In some cases, installing a microscope is not even feasible. Therefore, in this study, we propose a novel method to determine probe positions using electrical signals from the probes. This method enables precise determination of probe positions using a reference sheet and reference probes, even at low or high temperatures and under ultra-high vacuum or high-pressure conditions. The proposed method simplifies the integration of microscale multi-probe measurement systems into various devices, thereby advancing research on thin films and surfaces. |
| title | Probe position determination with multichannel I-V measurements in a two-dimensional sheet$\colon$ Computational method and mathematical analysis |
| topic | Applied Physics |
| url | https://arxiv.org/abs/2501.13388 |