Effective Defect Detection Using Instance Segmentation for NDI

Fuente: arXiv

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Bibliographic Details
Main Authors:	Rahman, Ashiqur, Seethi, Venkata Devesh Reddy, Yunker, Austin, Kral, Zachary, Kettimuthu, Rajkumar, Alhoori, Hamed
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2501.14149