Influence of Humidity on the Resistive Switching of Hexagonal Boron Nitride-Based Memristors

Fuente: arXiv
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Auteurs principaux: Völkel, Lukas, Ahmad, Rana Walied, Bestaeva, Alana, Braun, Dennis, Cruces, Sofía, Lee, Jimin, Pasko, Sergej, Krotkus, Simonas, Heuken, Michael, Menzel, Stephan, Lemme, Max C.
Format: Preprint
Publié: 2025
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author Völkel, Lukas
Ahmad, Rana Walied
Bestaeva, Alana
Braun, Dennis
Cruces, Sofía
Lee, Jimin
Pasko, Sergej
Krotkus, Simonas
Heuken, Michael
Menzel, Stephan
Lemme, Max C.
author_facet Völkel, Lukas
Ahmad, Rana Walied
Bestaeva, Alana
Braun, Dennis
Cruces, Sofía
Lee, Jimin
Pasko, Sergej
Krotkus, Simonas
Heuken, Michael
Menzel, Stephan
Lemme, Max C.
contents Two-dimensional material-based memristors have recently gained attention as components of future neuromorphic computing concepts. However, their surrounding atmosphere can influence their behavior. In this work, we investigate the resistive switching behavior of hexagonal boron nitride-based memristors with active nickel electrodes under vacuum conditions. Our cells exhibit repeatable, bipolar, nonvolatile switching under voltage stress after initial forming, with a switching window > 10${^3}$ under ambient conditions. However, in a vacuum, the forming is suppressed, and hence, no switching is observed. Compact model simulations can reproduce the set kinetics of our cells under ambient conditions and predict highly suppressed resistive switching in a water-deficient environment, supporting the experimental results. Our findings have important implications for the application of h-BN-based memristors with electrochemically active electrodes since semiconductor chips are typically processed under high vacuum conditions and encapsulated to protect them from atmospheric influences.
format Preprint
id arxiv_https___arxiv_org_abs_2501_16359
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Influence of Humidity on the Resistive Switching of Hexagonal Boron Nitride-Based Memristors
Völkel, Lukas
Ahmad, Rana Walied
Bestaeva, Alana
Braun, Dennis
Cruces, Sofía
Lee, Jimin
Pasko, Sergej
Krotkus, Simonas
Heuken, Michael
Menzel, Stephan
Lemme, Max C.
Materials Science
Applied Physics
Two-dimensional material-based memristors have recently gained attention as components of future neuromorphic computing concepts. However, their surrounding atmosphere can influence their behavior. In this work, we investigate the resistive switching behavior of hexagonal boron nitride-based memristors with active nickel electrodes under vacuum conditions. Our cells exhibit repeatable, bipolar, nonvolatile switching under voltage stress after initial forming, with a switching window > 10${^3}$ under ambient conditions. However, in a vacuum, the forming is suppressed, and hence, no switching is observed. Compact model simulations can reproduce the set kinetics of our cells under ambient conditions and predict highly suppressed resistive switching in a water-deficient environment, supporting the experimental results. Our findings have important implications for the application of h-BN-based memristors with electrochemically active electrodes since semiconductor chips are typically processed under high vacuum conditions and encapsulated to protect them from atmospheric influences.
title Influence of Humidity on the Resistive Switching of Hexagonal Boron Nitride-Based Memristors
topic Materials Science
Applied Physics
url https://arxiv.org/abs/2501.16359