Su, H., Lee, Y., Peña, T., Fultz-Waters, S., Kang, J., Köroğlu, Ç., . . . Pop, E. (2025). High-field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors.
Citazione stile Chigago Style (17a edizione)Su, Haotian, et al. High-field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors. 2025.
Citatione MLA (9a ed.)Su, Haotian, et al. High-field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors. 2025.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.