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High-field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Su, Haotian, Lee, Yuan-Mau, Peña, Tara, Fultz-Waters, Sydney, Kang, Jimin, Köroğlu, Çağıl, Wahid, Sumaiya, Newcomb, Christina J., Song, Young Suh, Wong, H. -S. Philip, Wang, Shan X., Pop, Eric
Format:	Preprint
Published:	2025
Subjects:	Applied Physics Mesoscale and Nanoscale Physics Materials Science
Online Access:	Acceder al recurso
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