Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jambigi, Neetha, Bogacz, Bartosz, Mueller, Moritz, Bach, Thomas, Felderer, Michael
Format:	Preprint
Published:	2025
Subjects:	Software Engineering Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2501.18005