An extensive thermal conductivity measurement method based on atomic force microscopy
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arXiv
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| Format: | Preprint |
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2025
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| _version_ | 1866910999591780352 |
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| author | Kasırga, T. Serkan Köker, Berke |
| author_facet | Kasırga, T. Serkan Köker, Berke |
| contents | Heat transport in low-dimensional solids can significantly differ from their bulk counterpart due to various size-related effects. This offers rich heat transport phenomena to emerge. However, finding an appropriate thermometry method for thermal conductivity measurements at the reduced size and dimensionality of the samples is a challenge. Here, we propose and study the feasibility of a nanoscale resolution thermal conductivity measurement method based on bolometric thermometry implemented on an atomic force microscopy (AFM). The local heat exchange between the AFM tip and the sample occurs at a suspended section of the sample, and thermal modeling of the measured electrical resistance change resulting from the bolometric effect provides a unique value for thermal conductivity. As we illustrate via thermal simulations, the proposed method can measure thermal conductivity with thermal disturbance to the sample in as little as 0.2 K at ~20 nm lateral resolution. Our in-depth analysis shows the feasibility and extensive applicability of the proposed AFM-based bolometric thermometry method on low-dimensional materials both in diffusive and ballistic heat transport regimes from cryogenic to above-room temperature. Consequently, the proposed method can lead to a deeper experimental understanding of fundamental questions in nanoscale and low-dimensional heat transport phenomena in many different material classes, as well as Fourier and non-Fourier heat transfer regimes. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2501_18384 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | An extensive thermal conductivity measurement method based on atomic force microscopy Kasırga, T. Serkan Köker, Berke Mesoscale and Nanoscale Physics Heat transport in low-dimensional solids can significantly differ from their bulk counterpart due to various size-related effects. This offers rich heat transport phenomena to emerge. However, finding an appropriate thermometry method for thermal conductivity measurements at the reduced size and dimensionality of the samples is a challenge. Here, we propose and study the feasibility of a nanoscale resolution thermal conductivity measurement method based on bolometric thermometry implemented on an atomic force microscopy (AFM). The local heat exchange between the AFM tip and the sample occurs at a suspended section of the sample, and thermal modeling of the measured electrical resistance change resulting from the bolometric effect provides a unique value for thermal conductivity. As we illustrate via thermal simulations, the proposed method can measure thermal conductivity with thermal disturbance to the sample in as little as 0.2 K at ~20 nm lateral resolution. Our in-depth analysis shows the feasibility and extensive applicability of the proposed AFM-based bolometric thermometry method on low-dimensional materials both in diffusive and ballistic heat transport regimes from cryogenic to above-room temperature. Consequently, the proposed method can lead to a deeper experimental understanding of fundamental questions in nanoscale and low-dimensional heat transport phenomena in many different material classes, as well as Fourier and non-Fourier heat transfer regimes. |
| title | An extensive thermal conductivity measurement method based on atomic force microscopy |
| topic | Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2501.18384 |