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Hauptverfasser: Srinivas, Shreyas, Jones, Ian W, Panic, Goran, Lenzen, Christoph
Format: Preprint
Veröffentlicht: 2025
Schlagworte:
Online-Zugang:https://arxiv.org/abs/2501.18843
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author Srinivas, Shreyas
Jones, Ian W
Panic, Goran
Lenzen, Christoph
author_facet Srinivas, Shreyas
Jones, Ian W
Panic, Goran
Lenzen, Christoph
contents We present a latch-based and PLL-free design of the voltage droop correction circuit of Lenzen, Fuegger, Kinali, and Wiederhake\cite{DroopJournal}. Such a circuit dynamically modifies the clock frequency of a digital clock for VLSI systems. Our circuit responds within two clock cycles and halves the length of the synchroniser chain compared to the previous design. Further, we introduce a differential sensor based design for masking latches as a replacement for masking flip flops that the design of \cite{DroopJournal} requires, but leaves unspecified. The use of latches instead of threshold-altered flip flops alters the timing properties of our design and thus the proofs of correctness that accompanied their design require modifications which we present here. This design has been successfully implemented on the IHP 130 nm process technology. The results of the experimental measurements will be discussed in a subsequent publication.
format Preprint
id arxiv_https___arxiv_org_abs_2501_18843
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Latch Based Design for Fast Voltage Droop Response
Srinivas, Shreyas
Jones, Ian W
Panic, Goran
Lenzen, Christoph
Hardware Architecture
We present a latch-based and PLL-free design of the voltage droop correction circuit of Lenzen, Fuegger, Kinali, and Wiederhake\cite{DroopJournal}. Such a circuit dynamically modifies the clock frequency of a digital clock for VLSI systems. Our circuit responds within two clock cycles and halves the length of the synchroniser chain compared to the previous design. Further, we introduce a differential sensor based design for masking latches as a replacement for masking flip flops that the design of \cite{DroopJournal} requires, but leaves unspecified. The use of latches instead of threshold-altered flip flops alters the timing properties of our design and thus the proofs of correctness that accompanied their design require modifications which we present here. This design has been successfully implemented on the IHP 130 nm process technology. The results of the experimental measurements will be discussed in a subsequent publication.
title Latch Based Design for Fast Voltage Droop Response
topic Hardware Architecture
url https://arxiv.org/abs/2501.18843