The Influence of V-Defects, Leakage, and Random Alloy Fluctuations on the Carrier Transport in Red InGaN MQW LEDs

Fuente: arXiv
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Bibliographic Details
Main Authors: Huang, Huai-Chin, Chen, Shih-Min, Weisbuch, Claude, Speck, James S., Wu, Yuh-Renn
Format: Preprint
Published: 2025
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