Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis
Fuente:
arXiv
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| Autori principali: | , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866910808682790912 |
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| author | Fabregas, Rene Gomila, Gabriel |
| author_facet | Fabregas, Rene Gomila, Gabriel |
| contents | Electrostatic force microscopy (EFM) can image nanoscale objects buried below the surface. Here, we theoretically show that this capability can be used to obtain nanotomographic information, i.e., the physical dimensions and dielectric properties, of buried nano-objects. These results constitute a first step toward implementing a nondestructive dielectric nanotomography technique based on EFM with applications in materials sciences and life sciences. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_00608 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis Fabregas, Rene Gomila, Gabriel Instrumentation and Detectors Materials Science Electrostatic force microscopy (EFM) can image nanoscale objects buried below the surface. Here, we theoretically show that this capability can be used to obtain nanotomographic information, i.e., the physical dimensions and dielectric properties, of buried nano-objects. These results constitute a first step toward implementing a nondestructive dielectric nanotomography technique based on EFM with applications in materials sciences and life sciences. |
| title | Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis |
| topic | Instrumentation and Detectors Materials Science |
| url | https://arxiv.org/abs/2502.00608 |