Exploring Few-Shot Defect Segmentation in General Industrial Scenarios with Metric Learning and Vision Foundation Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Liu, Tongkun, Li, Bing, Jin, Xiao, Shi, Yupeng, Li, Qiuying, Wei, Xiang
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.01216