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Characterization of CMOS sensor using X-ray irradiation

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Vijay, Anusree, Behera, Prafulla Kumar, Chembakan, Theertha, Dash, Ganapati
Formato:	Preprint
Publicado:	2025
Materias:	Instrumentation and Detectors High Energy Physics - Experiment
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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