An Analysis of LLM Fine-Tuning and Few-Shot Learning for Flaky Test Detection and Classification

Fuente: arXiv

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Bibliographic Details
Main Authors:	More, Riddhi, Bradbury, Jeremy S.
Format:	Preprint
Published:	2025
Subjects:	Software Engineering Artificial Intelligence D.2.5; I.2.7
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.02715