Terahertz Defect Detection in Multi-Layer Materials Using Echo Labeling

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sevdiren, Dogus Can, Ilgac, Furkan H., Sezgin, Aydin
Format:	Preprint
Published:	2025
Subjects:	Signal Processing Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.04135