Terahertz Defect Detection in Multi-Layer Materials Using Echo Labeling
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arXiv
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| Autori principali: | , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866929702073008128 |
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| author | Sevdiren, Dogus Can Ilgac, Furkan H. Sezgin, Aydin |
| author_facet | Sevdiren, Dogus Can Ilgac, Furkan H. Sezgin, Aydin |
| contents | Non-destructive testing is an important technique for detecting defects in multi-layer materials, enabling the evaluation of structural integrity without causing damage on test materials. Terahertz time-domain spectroscopy (THz-TDS) offers unique capabilities for this purpose due to its sensitivity and resolution. Inspired by room geometry estimation methods in acoustic signal processing, this work proposes a novel approach for defect detection in multi-layer composite materials using THz-TDS, enhanced by high-power sources. The proposed method utilizes Euclidean distance matrices to reduce problem complexity compared to state-of-the-art approaches, and effectively distinguishes and maps higher-order reflections from sublayers, enabling precise defect localization in composite materials without artifacts. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_04135 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Terahertz Defect Detection in Multi-Layer Materials Using Echo Labeling Sevdiren, Dogus Can Ilgac, Furkan H. Sezgin, Aydin Signal Processing Materials Science Non-destructive testing is an important technique for detecting defects in multi-layer materials, enabling the evaluation of structural integrity without causing damage on test materials. Terahertz time-domain spectroscopy (THz-TDS) offers unique capabilities for this purpose due to its sensitivity and resolution. Inspired by room geometry estimation methods in acoustic signal processing, this work proposes a novel approach for defect detection in multi-layer composite materials using THz-TDS, enhanced by high-power sources. The proposed method utilizes Euclidean distance matrices to reduce problem complexity compared to state-of-the-art approaches, and effectively distinguishes and maps higher-order reflections from sublayers, enabling precise defect localization in composite materials without artifacts. |
| title | Terahertz Defect Detection in Multi-Layer Materials Using Echo Labeling |
| topic | Signal Processing Materials Science |
| url | https://arxiv.org/abs/2502.04135 |