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Electrical Impedance Tomography for Anisotropic Media: a Machine Learning Approach to Classify Inclusions

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gaburro, Romina, Healy, Patrick, Naidu, Shraddha, Nolan, Clifford
Format:	Preprint
Published:	2025
Subjects:	Numerical Analysis Machine Learning 65N21, 35R30, 68T99
Online Access:	Acceder al recurso
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