Iterative Deepening Sampling as Efficient Test-Time Scaling

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chen, Weizhe, Koenig, Sven, Dilkina, Bistra
Format:	Preprint
Published:	2025
Subjects:	Computation and Language Artificial Intelligence Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.05449