Preserving Twist-Angle in Marginally Twisted Double-Bilayer Graphene Devices During Fabrication
Fuente:
arXiv
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| Autori principali: | , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866912400360341504 |
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| author | Jeong, Hyeon-Woo Kim, Jiho Chae, Boknam Watanabe, Kenji Taniguchi, Takashi Lee, Gil-Ho |
| author_facet | Jeong, Hyeon-Woo Kim, Jiho Chae, Boknam Watanabe, Kenji Taniguchi, Takashi Lee, Gil-Ho |
| contents | Twisted van der Waals heterostructures provide a platform for studying a wide range of electron correlation phenomena, including unconventional superconductivity and correlated insulating states. However, fabricating such devices is challenging due to the difficulty in achieving and maintaining homogeneous twist-angles. Here, we present a fabrication method to preserve the twist-angle with minimal deformation. We fabricated marginally twisted double-bilayer graphene (mTDBG) stacks and directly imaged the resulting triangular superlattice periodicity via scattering-type scanning near-field optical microscopy (s-SNOM). This technique enabled us to monitor twist-angle deformation at each fabrication step, paving the way for more reliable device fabrication and facilitating the exploration of twist-angle-dependent physics. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_05527 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Preserving Twist-Angle in Marginally Twisted Double-Bilayer Graphene Devices During Fabrication Jeong, Hyeon-Woo Kim, Jiho Chae, Boknam Watanabe, Kenji Taniguchi, Takashi Lee, Gil-Ho Mesoscale and Nanoscale Physics Materials Science Twisted van der Waals heterostructures provide a platform for studying a wide range of electron correlation phenomena, including unconventional superconductivity and correlated insulating states. However, fabricating such devices is challenging due to the difficulty in achieving and maintaining homogeneous twist-angles. Here, we present a fabrication method to preserve the twist-angle with minimal deformation. We fabricated marginally twisted double-bilayer graphene (mTDBG) stacks and directly imaged the resulting triangular superlattice periodicity via scattering-type scanning near-field optical microscopy (s-SNOM). This technique enabled us to monitor twist-angle deformation at each fabrication step, paving the way for more reliable device fabrication and facilitating the exploration of twist-angle-dependent physics. |
| title | Preserving Twist-Angle in Marginally Twisted Double-Bilayer Graphene Devices During Fabrication |
| topic | Mesoscale and Nanoscale Physics Materials Science |
| url | https://arxiv.org/abs/2502.05527 |