Characterization and Mitigation of ADC Noise by Reference Tuning in RRAM-Based Compute-In-Memory

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wei, Ying-Hao, Wan, Zishen, Crafton, Brian, Spetalnick, Samuel, Raychowdhury, Arijit
Format:	Preprint
Published:	2025
Subjects:	Emerging Technologies
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.05948