Transient studies using a TCAD and Allpix Squared combination approach
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arXiv
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| Main Authors: | , , , , , , , , , , , , , , , , , , , , , , , , |
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| Format: | Preprint |
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2025
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| _version_ | 1866910820347150336 |
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| author | Viera, Manuel A. Del Rio Buschmann, Eric Chauhan, Ankur Dannheim, Dominik Dort, Katharina Eckstein, Doris Feindt, Finn Gregor, Ingrid-Maria Hansen, Karsten He, Yajun Huth, Lennart Mendes, Larissa Mulyanto, Budi Rastorguev, Daniil Reckleben, Christian Daza, Sara Ruiz Schlaadt, Judith Schütze, Paul Simancas, Adriana Snoeys, Walter Spannagel, Simon Stanitzki, Marcel Velyka, Anastasiia Vignola, Gianpiero Wennlöf, Håkan |
| author_facet | Viera, Manuel A. Del Rio Buschmann, Eric Chauhan, Ankur Dannheim, Dominik Dort, Katharina Eckstein, Doris Feindt, Finn Gregor, Ingrid-Maria Hansen, Karsten He, Yajun Huth, Lennart Mendes, Larissa Mulyanto, Budi Rastorguev, Daniil Reckleben, Christian Daza, Sara Ruiz Schlaadt, Judith Schütze, Paul Simancas, Adriana Snoeys, Walter Spannagel, Simon Stanitzki, Marcel Velyka, Anastasiia Vignola, Gianpiero Wennlöf, Håkan |
| contents | The goal of the TANGERINE project is to develop the next generation of monolithic silicon pixel detectors using a 65 nm CMOS imaging process, which offers a higher logic density and overall lower power consumption compared to previously used processes. A combination of Technology Computer-Aided Design (TCAD) and Monte Carlo (MC) simulations is used to understand the physical processes within the sensing element and thus the overall performance of the pixel detector. The response of the sensors can then be tested in laboratory and test beam facilities and compared to simulation results. Transient simulations allow for studying the response of the sensor as a function of time, such as the signal produced after a charged particle passes through the sensor. The study of these signals is important to understand the magnitude and timing of the response from the sensors and improve upon them. While TCAD simulations are accurate, the time required to produce a single pulse is large compared to a combination of MC and TCAD simulations. In this work, a validation of the transient simulation approach and studies on charge collection are presented. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_06675 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Transient studies using a TCAD and Allpix Squared combination approach Viera, Manuel A. Del Rio Buschmann, Eric Chauhan, Ankur Dannheim, Dominik Dort, Katharina Eckstein, Doris Feindt, Finn Gregor, Ingrid-Maria Hansen, Karsten He, Yajun Huth, Lennart Mendes, Larissa Mulyanto, Budi Rastorguev, Daniil Reckleben, Christian Daza, Sara Ruiz Schlaadt, Judith Schütze, Paul Simancas, Adriana Snoeys, Walter Spannagel, Simon Stanitzki, Marcel Velyka, Anastasiia Vignola, Gianpiero Wennlöf, Håkan Instrumentation and Detectors The goal of the TANGERINE project is to develop the next generation of monolithic silicon pixel detectors using a 65 nm CMOS imaging process, which offers a higher logic density and overall lower power consumption compared to previously used processes. A combination of Technology Computer-Aided Design (TCAD) and Monte Carlo (MC) simulations is used to understand the physical processes within the sensing element and thus the overall performance of the pixel detector. The response of the sensors can then be tested in laboratory and test beam facilities and compared to simulation results. Transient simulations allow for studying the response of the sensor as a function of time, such as the signal produced after a charged particle passes through the sensor. The study of these signals is important to understand the magnitude and timing of the response from the sensors and improve upon them. While TCAD simulations are accurate, the time required to produce a single pulse is large compared to a combination of MC and TCAD simulations. In this work, a validation of the transient simulation approach and studies on charge collection are presented. |
| title | Transient studies using a TCAD and Allpix Squared combination approach |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2502.06675 |