A Framework for Supervised and Unsupervised Segmentation and Classification of Materials Microstructure Images
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| Main Authors: | , , , , |
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| Format: | Preprint |
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2025
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| _version_ | 1866909769624715264 |
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| author | Zhang, Kungang Chen, Wei Liu, Wing K. Brinson, L. Catherine Apley, Daniel W. |
| author_facet | Zhang, Kungang Chen, Wei Liu, Wing K. Brinson, L. Catherine Apley, Daniel W. |
| contents | Microstructure of materials is often characterized through image analysis to understand processing-structure-properties linkages. We propose a largely automated framework that integrates unsupervised and supervised learning methods to classify micrographs according to microstructure phase/class and, for multiphase microstructures, segments them into different homogeneous regions. With the advance of manufacturing and imaging techniques, the ultra-high resolution of imaging that reveals the complexity of microstructures and the rapidly increasing quantity of images (i.e., micrographs) enables and necessitates a more powerful and automated framework to extract materials characteristics and knowledge. The framework we propose can be used to gradually build a database of microstructure classes relevant to a particular process or group of materials, which can help in analyzing and discovering/identifying new materials. The framework has three steps: (1) segmentation of multiphase micrographs through a recently developed score-based method so that different microstructure homogeneous regions can be identified in an unsupervised manner; (2) {identification and classification of} homogeneous regions of micrographs through an uncertainty-aware supervised classification network trained using the segmented micrographs from Step $1$ with their identified labels verified via the built-in uncertainty quantification and minimal human inspection; (3) supervised segmentation (more powerful than the segmentation in Step $1$) of multiphase microstructures through a segmentation network trained with micrographs and the results from Steps $1$-$2$ using a form of data augmentation. This framework can iteratively characterize/segment new homogeneous or multiphase materials while expanding the database to enhance performance. The framework is demonstrated on various sets of materials and texture images. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2502_07107 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | A Framework for Supervised and Unsupervised Segmentation and Classification of Materials Microstructure Images Zhang, Kungang Chen, Wei Liu, Wing K. Brinson, L. Catherine Apley, Daniel W. Applications Computer Vision and Pattern Recognition Machine Learning Microstructure of materials is often characterized through image analysis to understand processing-structure-properties linkages. We propose a largely automated framework that integrates unsupervised and supervised learning methods to classify micrographs according to microstructure phase/class and, for multiphase microstructures, segments them into different homogeneous regions. With the advance of manufacturing and imaging techniques, the ultra-high resolution of imaging that reveals the complexity of microstructures and the rapidly increasing quantity of images (i.e., micrographs) enables and necessitates a more powerful and automated framework to extract materials characteristics and knowledge. The framework we propose can be used to gradually build a database of microstructure classes relevant to a particular process or group of materials, which can help in analyzing and discovering/identifying new materials. The framework has three steps: (1) segmentation of multiphase micrographs through a recently developed score-based method so that different microstructure homogeneous regions can be identified in an unsupervised manner; (2) {identification and classification of} homogeneous regions of micrographs through an uncertainty-aware supervised classification network trained using the segmented micrographs from Step $1$ with their identified labels verified via the built-in uncertainty quantification and minimal human inspection; (3) supervised segmentation (more powerful than the segmentation in Step $1$) of multiphase microstructures through a segmentation network trained with micrographs and the results from Steps $1$-$2$ using a form of data augmentation. This framework can iteratively characterize/segment new homogeneous or multiphase materials while expanding the database to enhance performance. The framework is demonstrated on various sets of materials and texture images. |
| title | A Framework for Supervised and Unsupervised Segmentation and Classification of Materials Microstructure Images |
| topic | Applications Computer Vision and Pattern Recognition Machine Learning |
| url | https://arxiv.org/abs/2502.07107 |