Detection of chiral spin fluctuations driven by frustration in Mott insulators

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hsu, Kuan H., Jia, Chunjing, Zhang, Emily Z., Jost, Daniel, Moritz, Brian, Hackl, Rudi, Devereaux, Thomas P.
Format:	Preprint
Published:	2025
Subjects:	Strongly Correlated Electrons Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.07108