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Main Authors: Jeong, S. G., Choi, I. H., Lee, S., Oh, J. Y., Nair, S., Lee, J. H., Kim, C., Seo, A., Choi, W. S., Low, T., Lee, J. S., Jalan, B.
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2502.08895
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author Jeong, S. G.
Choi, I. H.
Lee, S.
Oh, J. Y.
Nair, S.
Lee, J. H.
Kim, C.
Seo, A.
Choi, W. S.
Low, T.
Lee, J. S.
Jalan, B.
author_facet Jeong, S. G.
Choi, I. H.
Lee, S.
Oh, J. Y.
Nair, S.
Lee, J. H.
Kim, C.
Seo, A.
Choi, W. S.
Low, T.
Lee, J. S.
Jalan, B.
contents Ultrafast light-matter interactions inspire potential functionalities in picosecond optoelectronic applications. However, achieving directional carrier dynamics in metals remains challenging due to strong carrier scattering within a multiband environment, typically expected to isotropic carrier relaxation. In this study, we demonstrate epitaxial RuO2/TiO2 (110) heterostructures grown by hybrid molecular beam epitaxy to engineer polarization-selectivity of ultrafast light-matter interactions via anisotropic strain engineering. Combining spectroscopic ellipsometry, X-ray absorption spectroscopy, and optical pump-probe spectroscopy, we revealed the strong anisotropic transient optoelectronic response of strain-engineered RuO2/TiO2 (110) heterostructures along both in-plane [001] and [1-10] crystallographic directions. Theoretical analysis identifies strain-induced modifications in band nesting as the underlying mechanism for enhanced anisotropic carrier relaxation. These findings establish epitaxial strain engineering as a powerful tool for tuning anisotropic optoelectronic responses in metallic systems, paving the way for next-generation polarization-sensitive ultrafast optoelectronic devices.
format Preprint
id arxiv_https___arxiv_org_abs_2502_08895
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Anisotropic Strain Relaxation-Induced Directional Ultrafast Carrier Dynamics in RuO2 Films
Jeong, S. G.
Choi, I. H.
Lee, S.
Oh, J. Y.
Nair, S.
Lee, J. H.
Kim, C.
Seo, A.
Choi, W. S.
Low, T.
Lee, J. S.
Jalan, B.
Materials Science
Ultrafast light-matter interactions inspire potential functionalities in picosecond optoelectronic applications. However, achieving directional carrier dynamics in metals remains challenging due to strong carrier scattering within a multiband environment, typically expected to isotropic carrier relaxation. In this study, we demonstrate epitaxial RuO2/TiO2 (110) heterostructures grown by hybrid molecular beam epitaxy to engineer polarization-selectivity of ultrafast light-matter interactions via anisotropic strain engineering. Combining spectroscopic ellipsometry, X-ray absorption spectroscopy, and optical pump-probe spectroscopy, we revealed the strong anisotropic transient optoelectronic response of strain-engineered RuO2/TiO2 (110) heterostructures along both in-plane [001] and [1-10] crystallographic directions. Theoretical analysis identifies strain-induced modifications in band nesting as the underlying mechanism for enhanced anisotropic carrier relaxation. These findings establish epitaxial strain engineering as a powerful tool for tuning anisotropic optoelectronic responses in metallic systems, paving the way for next-generation polarization-sensitive ultrafast optoelectronic devices.
title Anisotropic Strain Relaxation-Induced Directional Ultrafast Carrier Dynamics in RuO2 Films
topic Materials Science
url https://arxiv.org/abs/2502.08895