Vision-Language In-Context Learning Driven Few-Shot Visual Inspection Model

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ueno, Shiryu, Hayashi, Yoshikazu, Nakatsuka, Shunsuke, Yamada, Yusei, Aizawa, Hiroaki, Kato, Kunihito
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2502.09057